Basu, J and Divakar, R and Ravishankar, N and Carter, CB (2008) Complementary Microscopy Techniques for Characterizing Nanostructures. In: Microscopy and Microanalysis, 14 (52). pp. 374-375.
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Official URL: http://journals.cambridge.org/action/displayAbstra...
Item Type: | Journal Article |
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Publication: | Microscopy and Microanalysis |
Publisher: | Cambridge University Press |
Additional Information: | Copyright of this article belongs to Cambridge University Press. |
Department/Centre: | Division of Chemical Sciences > Materials Research Centre |
Date Deposited: | 11 Aug 2011 11:28 |
Last Modified: | 10 Oct 2018 17:30 |
URI: | http://eprints.iisc.ac.in/id/eprint/39887 |
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