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Structural and dielectric properties of Bi2NbxVi−xO5.5 ceramics

Varma, KBR and Prasad, KVR (1996) Structural and dielectric properties of Bi2NbxVi−xO5.5 ceramics. In: Journal of Materials Research, 11 (9). 2288-2292 .

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Bi2Nbx V1−xO5.5 ceramics with x ranging from 0.01 to 0.5 have been prepared. The crystal system transforms from an orthorhombic to tetragonal at x 3= 0.1 and it persists until x = 0.5. Scanning electron microscopic (SEM) investigations carried out on thermally etched Bi2NbxV1−xO5.5 ceramics confirm that the grain size decreases markedly (18 μm to 4 μm) with increasing x. The shift in the Curie temperature (725 K) toward lower temperatures, with increasing x, is established by Differential Scanning Calorimetry (DSC). The dielectric constants as well as the loss tangent (tan δ) decrease with increasing x at room temperature.

Item Type: Journal Article
Publication: Journal of Materials Research
Publisher: Cambridge University Press
Additional Information: Copyright of this article belongs to Cambridge University Press.
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 19 Aug 2011 11:00
Last Modified: 19 Aug 2011 11:00
URI: http://eprints.iisc.ac.in/id/eprint/39839

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