Hudait, MK and Venkateswarlu, P and Krupanidhi, SB (2001) Electrical transport characteristics of Au/n-GaAs Schottky diodes on n-Ge at low temperatures. In: Solid-State Electronics, 45 (1). pp. 133-141.
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Abstract
The current�voltage characteristics of Au/n-GaAs Schottky diodes grown by metal-organic vapor-phase epitaxy on Ge substrates were determined in the temperature range 80�300 K. The zero-bias barrier height for current transport decreases and the ideality factor increases at low temperatures. The ideality factor was found to show the T0 effect and a higher characteristic energy. The excellent matching between the homogeneous barrier height and the effective barrier height was observed and infer good quality of the GaAs film. No generation�recombination current due to deep levels arising during the GaAs/Ge heteroepitaxy was observed in this study. The value of the Richardson constant was found to be 7.04 A K?2 cm?2, which is close to the value used for the determination of the zero-bias barrier height.
Item Type: | Journal Article |
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Publication: | Solid-State Electronics |
Publisher: | Elsevier Science |
Additional Information: | Copyright of this article belongs to Elsevier Science. |
Keywords: | GaAS;Schottky diodes;MOVPE;Ge. |
Department/Centre: | Division of Chemical Sciences > Materials Research Centre |
Date Deposited: | 02 Aug 2011 06:40 |
Last Modified: | 02 Aug 2011 06:40 |
URI: | http://eprints.iisc.ac.in/id/eprint/39540 |
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