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A Study of Memory Effect of Partial Discharges

Madhavi, YL and Narayanachar, MN (1999) A Study of Memory Effect of Partial Discharges. In: Eleventh International Symposium on High Voltage Engineering, 1999, 23-27 August, London, UK, Vol.5 305-308.


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From the computed conditional pulse amplitude and phase distributions it is shown that, as the gap spacing is reduced, the charging of a dielectric surface affects the corona pulse-time distribution which becomes significant at lower gap spacings. Most probable values are found to be the best statistical indicators for interpreting the results.

Item Type: Conference Paper
Publisher: IEE
Additional Information: Copyright of this article belongs to Institution of Electrical Engineers (IEE)
Department/Centre: Division of Electrical Sciences > High Voltage Engineering (merged with EE)
Date Deposited: 18 Oct 2005
Last Modified: 19 Sep 2010 04:20
URI: http://eprints.iisc.ac.in/id/eprint/3837

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