A Study of Memory Effect of Partial Discharges

Madhavi, YL and Narayanachar, MN (1999) A Study of Memory Effect of Partial Discharges. In: Eleventh International Symposium on High Voltage Engineering, 1999, 23-27 August, London, UK, Vol.5 305-308.

Preview

PDF study_of_memory.pdf Download (531kB)

Abstract

From the computed conditional pulse amplitude and phase distributions it is shown that, as the gap spacing is reduced, the charging of a dielectric surface affects the corona pulse-time distribution which becomes significant at lower gap spacings. Most probable values are found to be the best statistical indicators for interpreting the results.

Item Type:	Conference Paper
Publisher:	IEE
Additional Information:	Copyright of this article belongs to Institution of Electrical Engineers (IEE)
Department/Centre:	Division of Electrical Sciences > High Voltage Engineering (merged with EE)
Date Deposited:	18 Oct 2005
Last Modified:	19 Sep 2010 04:20
URI:	http://eprints.iisc.ac.in/id/eprint/3837

Actions (login required)

View Item