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Structural and electrical transport properties of Al-Cu-Cr quasicrystals

Banerjee, S and Goswami, R and Chattopadhyay, K and Raychaudhuri, AK (1995) Structural and electrical transport properties of Al-Cu-Cr quasicrystals. In: Physical Review B: Condensed Matter, 52 (5). 3220-3233 .

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Official URL: http://prb.aps.org/abstract/PRB/v52/i5/p3220_1


Transport properties of quasicrystals in rapidly solidified as well as heat-treated Al65CU20Cr15 alloys were studied over a wide temperature range as a function of structure and microstructure. The characterization was done using x-ray diffraction, transmission electron microscopy and differential scanning calorimetry. Particular attention was paid to primitive to face-centered quasicrystalline transformation which occurs on annealing and the effect of microstructures on the transport behavior. The temperature dependence of resistivity is found to depend crucially on the microstructure of the alloy. Further, ordering enhances the negative temperature coefficient of resistivity. The low-temperature (T less than or equal to 25 K) resistivity of Al65Cu20Cr15 has been compared with that of Al63.5Cu24.5Fe12 alloy. In this region p(T) can be well described by a root T contribution arising from electron-electron interaction. We discuss our results in view of current theories.

Item Type: Journal Article
Publication: Physical Review B: Condensed Matter
Publisher: The American Physical Society
Additional Information: Copyright of this article belongs to The American Physical Society.
Department/Centre: Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Division of Physical & Mathematical Sciences > Physics
Date Deposited: 26 May 2011 04:18
Last Modified: 26 May 2011 04:18
URI: http://eprints.iisc.ac.in/id/eprint/37924

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