On the anharmonic vibrations in crystalline silicon

Saravanan, R and Mohanlal, SK and Netaji, M (1995) On the anharmonic vibrations in crystalline silicon. In: Crystal Research and Technology, 30 (1). 115-120 .

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Abstract

Using a total of 1052 Bragg reflections of silicon, an X-ray investigation has been carried out to deduce the anharmonic thermal parameter beta, apart from the estimation of the harmonic contribution of the thermal vibration at room temperature. Reflections of type h + k + l = 4n, and 4n +/- 1 were used to estimate these parameters using MoKalpha radiation and a Nonius CAD-4 X-ray diffractometer. We obtain B(Si) = 0.451 (0.008) angstrom2 and beta(Si) = 0.279(2.630) eV angstrom-3 with R = 3.12%. The present B and beta values are in very good agreement with the earlier studies.

Item Type:	Journal Article
Publication:	Crystal Research and Technology
Publisher:	John Wiley and Sons
Additional Information:	Copyright of this article belongs to John Wiley and Sons.
Department/Centre:	Division of Chemical Sciences > Inorganic & Physical Chemistry
Date Deposited:	20 May 2011 07:09
Last Modified:	20 May 2011 07:09
URI:	http://eprints.iisc.ac.in/id/eprint/37784

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