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Structural and dielectric properties of Bi2NbxV1-xO5.5 ceramics

Varma, KBR and Prasad, KVR (1996) Structural and dielectric properties of Bi2NbxV1-xO5.5 ceramics. In: Journal of Materials Research, 11 (9). pp. 2288-2292.

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Bi2NbxV1-xO5.5 ceramics with x ranging from 0.01 to 0.5 have been prepared. The crystal system transforms from an orthorhombic to tetragonal at x greater than or equal to 0.1 and it persists until x = 0.5. Scanning electron microscopic (SEM) investigations carried out on thermally etched Bi2NbxV1-xO5.5 ceramics confirm that the grain size decreases markedly (18 mu m to 4 mu m) with increasing x. The shift in the Curie temperature (725 K) toward lower temperatures, with increasing x, is established by Differential Scanning Calorimetry (DSC). The dielectric constants as well as the loss tangent (tan delta) decrease with increasing x at room temperature.

Item Type: Journal Article
Publication: Journal of Materials Research
Publisher: Cambridge University Press
Additional Information: Copyright of this article belongs to Cambridge University Press.
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 13 May 2011 06:47
Last Modified: 13 May 2011 06:47
URI: http://eprints.iisc.ac.in/id/eprint/37559

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