Babu, Sarat Chandra S (1979) Surface Roughness Dependence of Laser Induced Damage Threshold. In: IEEE Journal of Quantum Electronics, 15 (7). pp. 533-535.
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Abstract
A functional relation between the rms roughness of a rough surface and the laser induced damage threshold is found. In deriving this relation it is assumed that the effective exposed area of the rough surface plays a dominant role in the damage mechanism. It is shown that the existing emperical relation between the rms roughness of a rough surface and the surface damage threshold could be derived from this functional relation under certain conditions.
Item Type: | Journal Article |
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Publication: | IEEE Journal of Quantum Electronics |
Publisher: | IEEE |
Additional Information: | ©1979 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics Division of Electrical Sciences > Electrical Communication Engineering |
Date Deposited: | 29 Sep 2005 |
Last Modified: | 19 Sep 2010 04:20 |
URI: | http://eprints.iisc.ac.in/id/eprint/3744 |
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