On generating optimal signal probabilities for random tests: A genetic approach

Srinivas, M and Patnaik, LM (1996) On generating optimal signal probabilities for random tests: A genetic approach. In: VLSI Design, 4 (3). pp. 207-215.

PDF 075798.pdf - Published Version Restricted to Registered users only Download (1MB) | Request a copy

Abstract

Genetic Algorithms are robust search and optimization techniques. A Genetic Algorithm based approach for determining the optimal input distributions for generating random test vectors is proposed in the paper. A cost function based on the COP testability measure for determining the efficacy of the input distributions is discussed, A brief overview of Genetic Algorithms (GAs) and the specific details of our implementation are described. Experimental results based on ISCAS-85 benchmark circuits are presented. The performance pf our GA-based approach is compared with previous results. While the GA generates more efficient input distributions than the previous methods which are based on gradient descent search, the overheads of the GA in computing the input distributions are larger. To account for the relatively quick convergence of the gradient descent methods, we analyze the landscape of the COP-based cost function. We prove that the cost function is unimodal in the search space. This feature makes the cost function amenable to optimization by gradient-descent techniques as compared to random search methods such as Genetic Algorithms.

Item Type:	Journal Article
Publication:	VLSI Design
Publisher:	Hindawi Publishing Corporation
Additional Information:	Copyright of this article belongs to Hindawi Publishing Corporation.
Keywords:	Testing;Random Test Vectors;Signal Probabilities;Genetic Algorithms;COP testability measure
Department/Centre:	Division of Electrical Sciences > Electrical Engineering
Date Deposited:	07 May 2011 04:42
Last Modified:	23 Oct 2018 08:02
URI:	http://eprints.iisc.ac.in/id/eprint/37434

Actions (login required)

View Item