ADC Static Nonlinearity Estimation Using Linearity Property of Sinewave

Vora, Santosh C and Satish, L (2011) ADC Static Nonlinearity Estimation Using Linearity Property of Sinewave. In: IEEE Transactions on Instrumentation and Measurement, 60 (4). pp. 1283-1290.

PDF ADC.pdf - Published Version Restricted to Registered users only Download (870kB) | Request a copy

Abstract

Prohibitive test time, nonuniformity of excitation, and signal nonlinearity are major concerns associated with employing dc, sine, and triangular/ramp signals, respectively, while determining static nonlinearity of analog-to-digital converters (ADCs) with high resolution (i.e., ten or more bits). Attempts to overcome these issues have been examined with some degree of success. This paper describes a novel method of estimating the ``true'' static nonlinearity of an ADC using a low-frequency sine signal (for example, less than 10 Hz) by employing the histogram-based approach. It is based on the well-known fact that the variation of a sine signal is ``reasonably linear'' when the angle is small, for example, in the range of +/- 5 degrees to +/- 7 degrees. In the proposed method, the ADC under test has to be ``fed'' with this ``linear'' portion of the sinewave. The presence of any harmonics and offset in input excitation makes this linear part of the sine signal marginally different compared with that of an ideal ramp signal of equal amplitude. However, since it is a sinusoid, this difference can be accurately determined and later compensated from the measured ADC output. Thus, the corrected ADC output will correspond to the true ADC static nonlinearity. The implementation of the proposed method is discussed along with experimental results for two 8-b ADCs and one 10-b ADC which are then compared with the static characteristics estimated by the conventional DC method.

Item Type:	Journal Article
Publication:	IEEE Transactions on Instrumentation and Measurement
Publisher:	IEEE
Additional Information:	Copyright 2011 IEEE. Personal use of this material is permitted.However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords:	Analog-to-digital converter (ADC);histogram test;IEEE 1057; nonlinearity;sinewave testing;static testing
Department/Centre:	Division of Electrical Sciences > Electrical Engineering
Date Deposited:	06 May 2011 06:22
Last Modified:	06 May 2011 06:22
URI:	http://eprints.iisc.ac.in/id/eprint/37389

Actions (login required)

View Item