Kondiparthi, Mahesh and Phani, Arindam (2010) Novel gray coded pattern for unwrapping phase in fringe projection based 3D profiling. In: Conference on Applications of Digital Image Processing XXXIII, AUG 02-04, 2010, San Diego, CA.
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Abstract
A method to reliably extract object profiles even with height discontinuities (that leads to 2n pi phase jumps) is proposed. This method uses Fourier transform profilometry to extract wrapped phase, and an additional image formed by illuminating the object of interest by a novel gray coded pattern for phase unwrapping. Simulation results suggest that the proposed approach not only retains the advantages of the original method, but also contributes significantly in the enhancement of its performance. Fundamental advantage of this method stems from the fact that both extraction of wrapped phase and unwrapping the same were done by gray scale images. Hence, unlike the methods that use colors, proposed method doesn't demand a color CCD camera and is ideal for profiling objects with multiple colors.
Item Type: | Conference Paper |
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Series.: | Proceedings of SPIE-The International Society for Optical Engineering |
Publisher: | The International Society for Optical Engineering |
Additional Information: | Copyright of this article belongs to The International Society for Optical Engineering. |
Keywords: | 3D profile; phase unwrapping; grayscale resolution; Fourier transform profilometry |
Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics Division of Physical & Mathematical Sciences > Physics |
Date Deposited: | 31 Mar 2011 07:30 |
Last Modified: | 07 Apr 2011 06:58 |
URI: | http://eprints.iisc.ac.in/id/eprint/36365 |
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