A Novel Technique to Measure the Propagation Loss of Integrated Optical Waveguides

Fazludeen, R and Barai, Samit and Pattnaik, Prasant Kumar and Srinivas, T and Selvarajan, A (2005) A Novel Technique to Measure the Propagation Loss of Integrated Optical Waveguides. In: IEEE Photonics Technology Letters, 17 (2). pp. 360-362.

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Abstract

A novel method is presented to measure the propagation loss of integrated optical waveguides. The measurement system involves two 3-dB couplers, a charge coupled device camera, and a signal processing unit. The propagation loss measured from this technique is found to be independent of coupling conditions. The propagation properties of low to high loss waveguides prepared by annealed proton exchange (APE) in lithium niobate $(LiNbO_3)$ and silver ion exchange in BK7 glass substrates are examined. The measurement system is found to be feasible over a broad range. This method offers a precision of 0.04 dB in case of a 25-mm-long waveguide prepared by APE.

Item Type:	Journal Article
Publication:	IEEE Photonics Technology Letters
Publisher:	IEEE
Additional Information:	�©2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords:	annealed proton exchanged (APE) waveguide;coupling conditions;integrated optics;propagation loss
Department/Centre:	Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited:	07 Aug 2005
Last Modified:	19 Sep 2010 04:19
URI:	http://eprints.iisc.ac.in/id/eprint/3459

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