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Control of barrier height of MIS tunnel diodes using deep level impurities

Chattopadhyay, P and Das, Krishna (1991) Control of barrier height of MIS tunnel diodes using deep level impurities. In: Solid-State Electronics, 34 (4). pp. 367-371.

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Official URL: http://dx.doi.org/10.1016/0038-1101(91)90165-U


The barrier height of MIS tunnel diodes is studied considering the effect of deep impurities. It is shown that the barrier height of a given MIS-system can be controlled by changing the density and the activation energy of the defect level. The study leads to the conclusion that deep impurities of character opposite to shallow impurities enhance the barrier height. On the other hand, the barrier height is lowered when the type of the deep impurities is the same as that of shallow impurities.

Item Type: Journal Article
Publication: Solid-State Electronics
Publisher: Elsevier science
Additional Information: Copyright of this article belongs to Elsevier science.
Keywords: Schottky Barriers;Solar-Cells;Silicon;Inversion;Surface; Layer;Si;Contacts;Si(111).
Department/Centre: Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Date Deposited: 10 Nov 2010 05:14
Last Modified: 10 Nov 2010 05:14
URI: http://eprints.iisc.ac.in/id/eprint/33715

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