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Structural, dielectric and ferroelectric properties of four-layer Aurivillius phase Na0.5La0.5Bi4Ti4O15

Kumar, Sunil and Varma, KBR (2010) Structural, dielectric and ferroelectric properties of four-layer Aurivillius phase Na0.5La0.5Bi4Ti4O15. In: Materials Science and Engineering B, 172 (2). pp. 177-182.

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Official URL: http://dx.doi.org/10.1016/j.mseb.2010.05.008

Abstract

Monophasic Na0.5La0.5Bi4Ti4O15 powders were synthesized via the conventional solid-state reaction route. The X-ray powder diffraction (XRD), selected area electron diffraction (SAED) and high resolution transmission electron microscopy (HRTEM) studies carried out on the as synthesized powdered samples confirmed the phase to be a four-layer Aurivillius that crystallizes in an orthorhombic A2(1)am space group. The microstructure and the chemical composition of the sintered sample were examined by scanning electron microscope (SEM) equipped with an energy dispersive X-ray analyzer (EDX). The dielectric properties of the ceramics have been studied in the 27-700 degrees C temperature range at various frequencies (100 Hz to 1 MHz). A sharp dielectric anomaly was observed at 580 degrees C for all the frequencies corresponding to the ferroelectric to paraelectric phase transition. Saturated ferroelectric hysteresis loops were observed at 200 degrees C and the associated remnant polarization (P-r) and coercive field (E-c) were found to be 7.4 mu C/cm(2) and 34.8 kV/cm, respectively. AC conductivity analysis confirmed the existence of two different conduction mechanisms in the ferroelectric region. Activation energies calculated from the Arrhenius plots were similar to 0.24 eV and similar to 0.84 eV in the 300-450 degrees C and 450-580 degrees C temperature ranges, respectively. (C) 2010 Elsevier B.V. All rights reserved.

Item Type: Journal Article
Publication: Materials Science and Engineering B
Publisher: Elsevier Science
Additional Information: Copyright of this article belong to Elsevier Science.
Keywords: Ceramics;Ferroelectrics;X-ray diffraction;Electron microscopy;Phase transition.
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 06 Sep 2010 11:16
Last Modified: 19 Sep 2010 06:15
URI: http://eprints.iisc.ac.in/id/eprint/31972

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