Computing complete test graphs for hierarchical systems

D'Souza, Deepak and Gopinathan, Madhu (2006) Computing complete test graphs for hierarchical systems. In: 4th IEEE International Conference on Software Engineering and Formal Methods, Pune, India, Sep 11-15, 2006, pp. 70-79.

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Abstract

Conformance testing focuses on checking whether an implementation. under test (IUT) behaves according to its specification. Typically, testers are interested it? performing targeted tests that exercise certain features of the IUT This intention is formalized as a test purpose. The tester needs a "strategy" to reach the goal specified by the test purpose. Also, for a particular test case, the strategy should tell the tester whether the IUT has passed, failed. or deviated front the test purpose. In [8] Jeron and Morel show how to compute, for a given finite state machine specification and a test purpose automaton, a complete test graph (CTG) which represents all test strategies. In this paper; we consider the case when the specification is a hierarchical state machine and show how to compute a hierarchical CTG which preserves the hierarchical structure of the specification. We also propose an algorithm for an online test oracle which avoids a space overhead associated with the CTG.

Item Type:	Conference Paper
Series.:	International Conference on Software Engineering and Formal Methods - SEFM
Publisher:	Institute of Electrical and Electronics Engineers
Additional Information:	Copyright 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Department/Centre:	Division of Electrical Sciences > Computer Science & Automation
Date Deposited:	02 Sep 2010 05:53
Last Modified:	10 Jun 2011 07:44
URI:	http://eprints.iisc.ac.in/id/eprint/30548

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