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Nanostructured Copper(II) oxide thin film for alcohol sensing

Parmar, Mitesh R and Gokhale, Nikhil and Rajanna, K (2009) Nanostructured Copper(II) oxide thin film for alcohol sensing. In: 26th IEEE International Instrumentation and Measurement Technology Conference, MAY 05-07, 2009, Singapore, pp. 327-330.

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Nanostructured copper(II) oxide film was deposited using reactive DC magnetron sputtering. It has been characterized using XRD, EDAX, XPS, and FESEM. The grain size of copper oxide film was found to be 40-65 nm with size distribution. The entire study was divided into two parts. In the first part, the film has been studied for its response to alcohol at different temperatures to find the optimum sensing temperature, whereas in the second part, the film sensitivity to different alcohol concentrations were studied at fixed optimum operating temperature. The optimum temperature for the response of ethanol was observed to be 400 C,and the response for different concentrations was found to be almost linear.

Item Type: Conference Paper
Series.: IEEE Instrumentation and Measurement Technology Conference
Publisher: IEEE
Additional Information: Copyright 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: Nanostructured Copper(II) oxide; XPS; EDAX ZAF Quantification; FESEM
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 26 May 2010 09:30
Last Modified: 19 Sep 2010 06:07
URI: http://eprints.iisc.ac.in/id/eprint/28035

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