Ravishankar, N (2010) Seeing is Believing: Electron Microscopy for Investigating Nanostructures. In: Journal of the Physical Chemistry Letters, 1 (8). pp. 1212-1220.
PDF
jz100163x.pdf - Published Version Restricted to Registered users only Download (3MB) | Request a copy |
Abstract
Controlling the properties of nanostructures requires a detailed understanding of structure, microstructure, and chemistry at ever-decreasing length scales. The modern day transmission electron microscope has thus become an indispensable tool in the study of nanostructures. In this Perspective, we present a brief account of the capabilities of the TEM with some typical examples for characterizing nanostructures. The modern-day TEM has moved from a simple characterization tool to a nanoscale laboratory enabling in situ observation of several fundamental processes at unprecedented resolution levels.
Item Type: | Journal Article |
---|---|
Publication: | Journal of the Physical Chemistry Letters |
Publisher: | American Chemical Society |
Additional Information: | Copyright of this article belongs to American Chemical Society. |
Department/Centre: | Division of Chemical Sciences > Materials Research Centre |
Date Deposited: | 12 May 2010 08:45 |
Last Modified: | 19 Sep 2010 06:06 |
URI: | http://eprints.iisc.ac.in/id/eprint/27713 |
Actions (login required)
View Item |