Thathachary, Arun V and Bhat, KN and Bhat, Navakanta and Hegde, MS (2010) Fermi level depinning at the germanium Schottky interface through sulfur passivation. In: Applied Physics Letters, 96 (15).
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Abstract
We demonstrate the depinning of Fermi level on both p- and n-type germanium after sulfur passivation by aqueous (NH4)(2)S treatment. Schottky contacts realized using metals with a wide range of work functions produce nearly ideal behavior confirming that the Fermi level is depinned. Examination of the passivated surface using x-ray photoelectron spectroscopy reveals bonding between Ge and sulfur.It is shown that good Ohmic contacts to n-type Ge and a hole barrier height (phi(Bp)) of 0.6 eV to p-type Ge can be achieved after this passivation treatment, with Zr Schottky contacts. This is the highest phi(Bp) reported so far.
Item Type: | Journal Article |
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Publication: | Applied Physics Letters |
Publisher: | American Institute of Physics |
Additional Information: | Copyright of this article belongs to American Institute of Physics. |
Keywords: | elemental semiconductors;Fermi level;germanium;interface states;ohmic contacts;passivation;Schottky barriers; work function;X-ray photoelectron spectra; zirconium |
Department/Centre: | Division of Chemical Sciences > Solid State & Structural Chemistry Unit Division of Electrical Sciences > Electrical Communication Engineering |
Date Deposited: | 03 May 2010 06:47 |
Last Modified: | 19 Sep 2010 06:01 |
URI: | http://eprints.iisc.ac.in/id/eprint/27463 |
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