Gorthi, Sai Siva and Lolla, Kameswara Rao (2005) A new approach for simple and rapid shape measurement of objects with surface discontinuities. In: Conference on Optical Measurement Systems for Industrial Inspection IV, JUN 13-17, 2005, Munich.
Full text not available from this repository. (Request a copy)Abstract
A new approach for unwrapping phase maps, obtained during the measurement of 3-D surfaces using sinusoidal structured light projection technique, is proposed. "Takeda's method" is used to obtain the wrapped phase map. Proposed method of unwrapping makes use of an additional image of the object captured under the illumination of a specifically designed color-coded pattern. The new approach demonstrates, for the first time, a method of producing reliable unwrapping of objects even with surface discontinuities from a single-phase map. It is shown to be significantly faster and reliable than temporal phase unwrapping procedure that uses a complete exponential sequence. For example, if a measurement with the accuracy obtained by interrogating the object with S fringes in the projected pattern is carried out with both the methods, new method requires only 2 frames as compared to (log(2)S +1) frames required by the later method.
| Item Type: | Conference Paper |
|---|---|
| Publisher: | The International Society for Optical Engineering |
| Additional Information: | Copyright of this article belongs to The International Society for Optical Engineering. |
| Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics |
| Date Deposited: | 28 Apr 2010 05:11 |
| Last Modified: | 28 Apr 2010 05:11 |
| URI: | http://eprints.iisc.ac.in/id/eprint/27323 |
Actions (login required)
 |
View Item |
