EIT as a tool to observe dual wavelength operation of a semiconductor laser

Iftiquar, SM (2010) EIT as a tool to observe dual wavelength operation of a semiconductor laser. In: Optics & Laser Technology, 42 (2). pp. 313-316.

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Abstract

We propose a simplified technique for dual wavelength operation of an extended cavity semiconductor laser, and its characterization using electromagnetically induced transparency (EIT). In this laser cavity scheme light beam is made converging before it incidences on the cavity grating. The converging angle of the beam creates two longitudinal oscillating modes of resonating cavity. Frequency separation between the longitudinal modes are measured with the help of beat frequency generation in a photodiode and creating pair of EIT spectra in Rb vapor. The pair of EIT dips that are generated due to dual wavelength of this laser (that is used as control laser) can be used to estimate frequency difference between the generated wavelengths. Width of EIT spectra can be used to estimate line width of individual wavelength components.

Item Type:	Journal Article
Publication:	Optics & Laser Technology
Publisher:	Elsevier science
Additional Information:	Copyright for this article belongs to Elsevier science.
Keywords:	Dual wavelength laser; Electromagnetically induced transparency
Department/Centre:	Division of Physical & Mathematical Sciences > Physics
Date Deposited:	09 Feb 2010 11:29
Last Modified:	19 Sep 2010 05:54
URI:	http://eprints.iisc.ac.in/id/eprint/25505

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