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A fluctuation-based characterization of athermal phase transitions:Application to shape memory alloys

Chandni, U and Kar-Narayan, Sohini and Ghosh, Arindam and Vijaya, HS and Mohan, S (2009) A fluctuation-based characterization of athermal phase transitions:Application to shape memory alloys. In: Acta materialia, 57 (20). pp. 6113-6122.

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We employ a fluctuation-based technique to investigate the athermal component associated with martensite phase transition, which is a prototype of temperature-driven structural transformation. Statistically, when the phase transition is purely athermal, we find that the temporal sequence of avalanches under constant drive is insensitive to the drive rate. We have used fluctuations in electrical resistivity or noise in nickel titanium shape memory alloys in three different forms: a thin film exhibiting well-defined transition temperatures,a highly disordered film, and a bulk wire of rectangular cross-section. Noise is studied in the realm of dynamic transition,viz.while the temperature is being ramped, which probes into the kinetics of the transformation at real time scales,and could probably stand out as a promising tool for material testing in various other systems, including nanoscale devices.

Item Type: Journal Article
Publication: Acta materialia
Publisher: Elsevier Science
Additional Information: copyright of this article belongs to Elsevier Science.
Keywords: Martensite transition;Conductivity noise;Athermal transition.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Division of Physical & Mathematical Sciences > Physics
Date Deposited: 11 Jan 2010 09:07
Last Modified: 19 Sep 2010 05:53
URI: http://eprints.iisc.ac.in/id/eprint/25248

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