X-ray photoelectron spectroscopic studies on Se/As2S3 and Sb/As2S3 nanomultilayered film

Naik, Ramakanta and Adarsh, KV and Ganesan, R and Sangunni, KS and Kokenyesi, S and Deshpande, Uday and Shripathi, T (2009) X-ray photoelectron spectroscopic studies on Se/As2S3 and Sb/As2S3 nanomultilayered film. In: International Symposium on Non-Oxide and New Optical Glasses, APR 20-25, 2008, Montpellier,France, pp. 1836-1839.

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Abstract

Photoinduced diffusion in Se/As2S3 and Sb/As2S3 nanomultilayered thin films are studied by X-ray photoelectron spectroscopy (XPS). The XPS measurements show the atomic movements during photoinduced diffusion in Se/As2S3 and Sb/As2S3 nanomultilayered film. The analysis of experimental data describes the nature of light induced changes indifferent structural units. (C) 2009 Elsevier B.V. All rights reserved.

Item Type:	Conference Paper
Publication:	JOURNAL OF NON-CRYSTALLINE SOLIDS
Publisher:	Elsevier Science
Additional Information:	Copyright for this article belongs to Elsevier Science.
Keywords:	UPS/XPS;Chalcogenides;Photoinduced effects
Department/Centre:	Division of Physical & Mathematical Sciences > Physics
Date Deposited:	07 Jan 2010 05:48
Last Modified:	29 Feb 2012 04:56
URI:	http://eprints.iisc.ac.in/id/eprint/24816

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