Rao, CNR and Biswas, Kanishka (2009) Characterization of Nanomaterials by Physical Methods. In: Annual Review Of Analytical Chemistry, 2 . pp. 435-462.
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Much progress in nanoscience and nanotechnology has been made in the past few years thanks to the increased availability of sophisticated physical methods to characterize nanomaterials. These techniques include electron microscopy and scanning probe microscopies, in addition to standard techniques such as X-ray and neutron diffraction, X-ray scattering, and various spectroscopies. Characterization of nanomaterials includes the determination not only of size and shape, but also of the atomic and electronic structures and other important properties. In this article we describe some of the important methods employed for characterization of nanostructures, describing a few case studies for illustrative purposes. These case studies include characterizations of Au, ReO3, and GaN nanocrystals; ZnO, Ni, and Co nanowires; inorganic and carbon nanotubes; and two-dimensional graphene.
| Item Type: | Journal Article |
|---|---|
| Publication: | Annual Review Of Analytical Chemistry |
| Publisher: | Annual Reviews |
| Additional Information: | Copy rights of this article belongs to Nnual Review Of Analytical Chemistry. |
| Keywords: | Electron Microscopy; Scanning Probe Microscopies; Diffraction;Nanocrystals; Nanowires; Nanotubes. |
| Department/Centre: | Division of Chemical Sciences > Solid State & Structural Chemistry Unit |
| Date Deposited: | 10 Aug 2009 05:03 |
| Last Modified: | 10 Aug 2009 05:03 |
| URI: | http://eprints.iisc.ac.in/id/eprint/22097 |
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