Kim, HJ and Karthikeyan, S and Rigney, D (2009) A simulation study of the mixing, atomic flow and velocity profiles of crystalline materials during sliding. In: 17th International Conference on Wear of Materials, 19-23, Las Vegas, NV, pp. 1130-1136.
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Abstract
Self-contained Non-Equilibrium Molecular Dynamics (NEMD) simulations using Lennard-Jones potentials were performed to identify the origin and mechanisms of atomic scale interfacial behavior between sliding metals. The mixing sequence and velocity profiles were compared via MD simulations for three cases, viz.: sell-mated, similar and hard-softvcrystal pairs. The results showed shear instability, atomic scale mixing, and generation of eddies at the sliding interface. Vorticity at the interface suggests that atomic flow during sliding is similar to fluid flow under Kelvin-Helmholtz instability and this is supported by velocity profiles from the simulations. The initial step-function velocity profile spreads during sliding. However the velocity profile does not change much at later stages of the simulation and it eventually stops spreading. The steady state friction coefficient during simulation was monitored as a function of sliding velocity. Frictional behavior can be explained on the basis of plastic deformation and adiabatic effects. The mixing layer growth kinetics was also investigated.
Item Type: | Conference Paper |
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Publication: | WEAR |
Publisher: | Elsevier Science |
Additional Information: | Copyright 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
Keywords: | MD simulation;Mixing;Velocity profile;Vorticity |
Department/Centre: | Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy) |
Date Deposited: | 15 Dec 2009 06:59 |
Last Modified: | 19 Sep 2010 05:38 |
URI: | http://eprints.iisc.ac.in/id/eprint/21624 |
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