Sampathkumaran, EV and Vijayaraghavan, R and Sen, P and Rao, CNR (1987) Ce CORE level X-ray photo electron spectroscopy of CeX2Si2 (X = Fe, Co, Ni and Cu). In: Solid State Communications, 63 (4). pp. 345-347.
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Abstract
Ce(3d) and (4d) core level XPS spectra of CeX = Fe, Co, Ni and Cu) suggest that the mean valence of Ce was as well as 4f hybridization strength decrease systematically from Fe to Cu. This observation is in agreement with the results of Bremstrahlung Isochromat Spectroscopy (BIS), but in disagreement with LIII-edge data reported earlier.
| Item Type: | Journal Article |
|---|---|
| Publication: | Solid State Communications |
| Publisher: | Elsevier Science |
| Additional Information: | Copy right of this article belongs to Elsevier Science |
| Department/Centre: | Division of Chemical Sciences > Solid State & Structural Chemistry Unit |
| Date Deposited: | 01 Jul 2009 11:49 |
| Last Modified: | 19 Sep 2010 05:35 |
| URI: | http://eprints.iisc.ac.in/id/eprint/21042 |
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