ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Impurity states in Sb-doped amorphous semiconductors

Gosain, DP and Bhatia, KL and Parthasarathy, G and Gopal, ESR (1987) Impurity states in Sb-doped amorphous semiconductors. In: Journal of Applied Physics, 62 (6). 2313 -2319.

[img] PDF
70.pdf - Published Version
Restricted to Registered users only

Download (690kB) | Request a copy
Official URL: http://scitation.aip.org/getabs/servlet/GetabsServ...

Abstract

A systematic investigation of the effects of antimony dopant on the electronic transport properties of amorphous (GeSe3.5)100−xSbx under high pressure (up to 120 kbar) has been carried out down to liquid-nitrogen temperature for the first time. Differential thermal analysis and x-ray diffraction methods were used for the characterization of freshly prepared and pressure-quenched materials which indicated the presence of structural phase transition in both GeSe3.5 and (GeSe3.5)100−xSbx around 105 kbar pressure. Electrical transport data revealed the strong compositional dependence of the electronic conduction process. A distinct kink in the conductivity temperature plot at pressures>15 kbar was observed in the Sb-doped compositions indicating the presence of different conduction processes. An attempt has been made to interpret the pressure-induced effect in the transport properties of these glasses considering the possible presence of both thermally activated conduction in the extended states and hopping process in the localized tail states. However, the interpretation of the transport data is not straightforward and the pressure dependence of the thermoelectric power will be needed to complete the picture. Journal of Applied Physics is copyrighted by The American Institute of Physics.

Item Type: Journal Article
Publication: Journal of Applied Physics
Publisher: American Institute of Physics
Additional Information: Copyright Of This Article Belongs To American Institute of Physics.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 20 Aug 2009 12:02
Last Modified: 19 Sep 2010 05:34
URI: http://eprints.iisc.ac.in/id/eprint/20708

Actions (login required)

View Item View Item