Analysis Of The Energy Quantization Effects On Single Electron Inverter Performance Through Noise Margin Modeling

Dan, Surya Shankar and Mahapatra, Santanu (2009) Analysis Of The Energy Quantization Effects On Single Electron Inverter Performance Through Noise Margin Modeling. In: Proceedings of the 2009 22nd International Conference on VLSI Design . pp. 493-498.

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Abstract

Possible integration of Single Electron Transistor (SET) with CMOS technology is making the study of semiconductor SET more important than the metallic SET and consequently, the study of energy quantization effects on semiconductor SET devices and circuits is gaining significance. In this paper, for the first time, the effects of energy quantization on SET inverter performance are examined through analytical modeling and Monte Carlo simulations. It is observed that the primary effect of energy quantization is to change the Coulomb Blockade region and drain current of SET devices and as a result affects the noise margin, power dissipation, and the propagation delay of SET inverter. A new model for the noise margin of SET inverter is proposed which includes the energy quantization effects. Using the noise margin as a metric, the robustness of SET inverter is studied against the effects of energy quantization. It is shown that SET inverter designed with CT : CG = 1/3 (where CT and CG are tunnel junction and gate capacitances respectively) offers maximum robustness against energy quantization.

Item Type:	Journal Article
Publication:	Proceedings of the 2009 22nd International Conference on VLSI Design
Series.:	International Conference on VLSI Design, Proceedings
Publisher:	IEEE
Additional Information:	Copyright of this article 2009 belongs to IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Department/Centre:	Division of Electrical Sciences > Electronic Systems Engineering (Formerly Centre for Electronic Design & Technology)
Date Deposited:	04 May 2009 10:59
Last Modified:	19 Sep 2010 05:30
URI:	http://eprints.iisc.ac.in/id/eprint/19899

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