Identification of the nature of platinum related midgap state in silicon by deep level transient spectroscopy

Rao, KSRK and Rangaiah, Pandu SV and Reddy, PN and Reddy, BPN (1999) Identification of the nature of platinum related midgap state in silicon by deep level transient spectroscopy. In: Journal of Applied Physics, 85 (4). pp. 2175-2178.

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Abstract

In this article, we present the detailed investigations on platinum related midgap state corresponding to E-c -0.52 eV probed by deep level transient spectroscopy. By irradiating the platinum doped samples with high-energy (1.1 MeV) gamma rays, we observed that the concentration of the midgap state increases and follows a square dependence with irradiation dose. However, the concentration of the acceptor corresponding to E-c -20.28 eV remained constant. Furthermore, from the studies on passivation by atomic hydrogen and thermal reactivation, we noticed that the E-c -0.52 eV level reappears in the samples annealed at high temperatures after hydrogenation. The interaction of platinum with various defects and the qualitative arguments based on the law of mass action suggest that the platinum related midgap defect might possibly correspond to the interstitial platinum-divacancy complex (V-Pt-V).

Item Type:	Journal Article
Publication:	Journal of Applied Physics
Publisher:	American Institute of Physics
Additional Information:	Copyright of this article belongs to American Institute of Physics.
Department/Centre:	Division of Physical & Mathematical Sciences > Physics
Date Deposited:	12 Aug 2009 11:30
Last Modified:	19 Sep 2010 05:30
URI:	http://eprints.iisc.ac.in/id/eprint/19776

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