Within-Die Gate Delay Variability Measurement using Re-configurable Ring Oscillator

Das, Bishnu Prasad and Amrutur, Bharadwaj and Jamadagni, HS and Arvind, NV and Visvanathan, V (2008) Within-Die Gate Delay Variability Measurement using Re-configurable Ring Oscillator. In: Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE, 21-24 Sept. 2008, San Jose, CA, pp. 133-136.

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Abstract

We report a circuit technique to measure the on-chip delay of an individual logic gate (both inverting and non-inverting) in its unmodified form using digitally reconfigurable ring oscillator (RO). Solving a system of linear equations with different configuration setting of the RO gives delay of an individual gate. Experimental results from a test chip in 65nm process node show the feasibility of measuring the delay of an individual inverter to within 1pS accuracy. Delay measurements of different nominally identical inverters in close physical proximity show variations of up to 26% indicating the large impact of local or within-die variations.

Item Type:	Conference Poster
Publisher:	IEEE
Additional Information:	Copyright of this article belongs to IEEE. "YEAR IEEE. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Raman Research Institute's's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it." IEEE Custom Integrated Circuits Conference, San Jose, CA, SEP 21-24,2008
Department/Centre:	Division of Electrical Sciences > Electronic Systems Engineering (Formerly Centre for Electronic Design & Technology) Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited:	24 Mar 2009 09:20
Last Modified:	19 Sep 2010 05:27
URI:	http://eprints.iisc.ac.in/id/eprint/19202

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