Annealing effect on structural and electrical properties of thermally evaporated $Cd_{1-x}Mn_{x}S$ nanocrystalline films

Reddy, Sreekantha D and Rao, Narasimha K and Gunasekhar, KR and Reddy, Koteeswara N and Kumar, Siva K and Reddy, Sreedhara P (2008) Annealing effect on structural and electrical properties of thermally evaporated $Cd_{1-x}Mn_{x}S$ nanocrystalline films. In: Materials Research Bulletin, 43 (12). pp. 3245-3251.

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Abstract

Thin films of Cd1-xMnxS (0 <= x <= 0.5) were deposited on glass substrates by thermal evaporation. All the films were deposited at 300 K and annealed at 573 K. The as-deposited and the annealed films were characterized for composition. structure and microstructure by using energy-dispersive analysis for X-rays, X-ray diffraction, scanning electron microscopy and atomic force microscopy. Electrical conductivity was studied in the temperature range 190-450 K. All the films exhibited wurtzite structure of the host material with the grain size varying in the range between 36 and 82 nm. Resistivity of all the films is strongly dependent on Mn content and annealing temperature and lies in the range 13-160 Omega cm.

Item Type:	Journal Article
Publication:	Materials Research Bulletin
Publisher:	Elsevier.
Additional Information:	Copyright of this article belongs to Elsevier.
Keywords:	Atomic force microscopy;Electrical properties.
Department/Centre:	Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited:	27 Feb 2009 12:37
Last Modified:	19 Sep 2010 04:58
URI:	http://eprints.iisc.ac.in/id/eprint/17819

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