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Annealing effect on physical properties of thermally evaporated MnS nanocrystalline films

Reddy, D Sreekanta and Reddy, D Raja and Reddy, BK and Reddy, A Mallikarjuna and Gunasekhar, KR and Reddy, P Sreedhara (2007) Annealing effect on physical properties of thermally evaporated MnS nanocrystalline films. In: Journal of OptoElectronics and Advanced Materials, 9 (7). pp. 2019-2022.

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MnS nano-crystalline films were formed on glass substrates by thermal evaporation technique at room temperature (300 K) and the films were annealed at 573 K. The films were characterized for composition, structure and surface morphology by using EDAX, XRD, SEM and AFM. The optical properties were studied by spectrophotometer. AFM studies showed that all the films were in nanocrystalline form with the grain size varying in the range between 30-32 nm and exhibited wurtzite structure. The lattice parameter and band gaps (3,842-3.916 eV) increase with increasing annealing temperature

Item Type: Journal Article
Publication: Journal of OptoElectronics and Advanced Materials
Publisher: National Institute of Optoelectronics
Additional Information: Copyright of this article belongs to National Institute of Optoelectronics.
Keywords: Magnetic Semiconductors;MnS nanocrystalline films;Wurtzite structure;Optical properties.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 03 Dec 2008 07:00
Last Modified: 19 Sep 2010 04:54
URI: http://eprints.iisc.ac.in/id/eprint/16863

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