The presence of a thermally reversing window in Al–Te–Si glasses revealed by alternating differential scanning calorimetry and electrical switching studies

Anbarasu, M and Singh, KK and Asokan, S (2008) The presence of a thermally reversing window in Al–Te–Si glasses revealed by alternating differential scanning calorimetry and electrical switching studies. In: Journal of Non-Crystalline Solids, 354 (28). pp. 3369-3374.

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Abstract

Alternating differential scanning calorimetric (ADSC) studies and electrical switching experiments have been undertaken on $Al_{15}Te_{85-x}Si_x$ (2 \leq x \leq 12) system of glasses. These glasses are found to exhibit two crystallization reactions $(T_{c1} and T_{c2})$, for compositions with x < 8. Above x = 8, a single-stage crystallization is seen. Further, a trough is seen in the composition dependence of nonreversing enthalpy (DHNR), based on which it is proposed that there is a thermally reversing window in $Al_{15} Te_{85-x}Si_x$ glasses, in the composition range 4 \leq x \leq 8. Electrical switching studies indicate that $Al_{15} Te_{85-x}Si_x$ glasses exhibit a threshold type electrical switching at ON state currents less than 2 mA. Further, the switching voltages are found to increase with the increase in silicon content. It is interesting to note that the start (x = 4) and the end (x = 8) of the thermally reversing window are exemplified by a kink and a saturation in the composition dependence of switching voltages, respectively.

Item Type:	Journal Article
Publication:	Journal of Non-Crystalline Solids
Publisher:	Elsevier Science
Additional Information:	Copyright of this article belongs to Elsevier Science.
Keywords:	Amorphous semiconductors;Chalcogenides;High field effects; Calorimetry.
Department/Centre:	Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited:	21 Jul 2008
Last Modified:	19 Sep 2010 04:47
URI:	http://eprints.iisc.ac.in/id/eprint/15183

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