Lyman, Charles E and Newbury, Dale E and Goldstein, Joseph I and Williams, David B and Romig, Alton D and Armstrong, John T and Echlin, Patrick and Fiori, Charles E and Joy, David C and Lifshin, Eric and Peters, Klaus-Ruediger (1993) Scanning Electron Microscopy, X-Ray Microanalysis and Analytical Electron Microscopy. In: Journal of the Electrochemical Society of India, 42 (4). pp. 262-263.
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| Item Type: | Journal Article |
|---|---|
| Publication: | Journal of the Electrochemical Society of India |
| Publisher: | Electrochemical Society of India |
| Additional Information: | Copyright of this article belongs to Electrochemical Society of India. |
| Department/Centre: | Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy) |
| Date Deposited: | 11 Aug 2008 |
| Last Modified: | 27 Aug 2008 13:29 |
| URI: | http://eprints.iisc.ac.in/id/eprint/14518 |
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