High resolution electron microscopy of bismuth oxides with perovskite layers

Subbanna, GN and Ganapathi, L (1987) High resolution electron microscopy of bismuth oxides with perovskite layers. In: Bulletin of Materials Science, 9 (1). pp. 29-35.

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Abstract

Layered bismuth oxides of the general formula $(Bi_2O_2)^{2+}$ $(A_{n-1}B_nO_{3n+1})^{2-}$ where A = Bi or Ba, B = Ti, Fe, W and n = number of perovskite layers have been investigated by high resolution electron microscopy. Lattice images obtained for n = 1 to 6 members show stacking of (n-1) perovskite layers sandwiched between dark bands due to the $(Bi_2O_2)^{2+}$ layers. It was possible to resolve the perovskite layer structures in some of the oxides. A highly ordered structure was observed upto the n = 3 member, whereas higher members show superstructures, dislocations and stacking faults arising from the side-stepping of $(Bi_2O_2)^{2+}$ layers as well as ferroelectric domain walls.

Item Type:	Journal Article
Publication:	Bulletin of Materials Science
Publisher:	Indian Academy of Sciences
Additional Information:	Copyright of this article belongs to Indian Academy of Sciences.
Keywords:	Electron microscopy;lattice images;defect structures;Aurivillius oxides.
Department/Centre:	Division of Chemical Sciences > Materials Research Centre Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Date Deposited:	24 Jun 2008
Last Modified:	19 Sep 2010 04:46
URI:	http://eprints.iisc.ac.in/id/eprint/14428

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