Composition tunable memory and threshold switching in Al20AsxTe802x semiconducting glasses

Murugavel, S and Asokan, S (1998) Composition tunable memory and threshold switching in Al20AsxTe802x semiconducting glasses. In: Journal of Materials Research, 13 (10). pp. 2982-2987.

Preview

PDF composition.pdf Download (204kB)

Abstract

I-V studies indicate a composition dependent switching behavior (Memory or Threshold) in bulk Al20AsxTe80-x glasses, which is determined by the coordination and composition of aluminum. Investigations on temperature and thickness dependence of switching and structural studies on switched samples suggest thermal and electronic mechanisms of switching for the memory and threshold samples, respectively. The present results also show that these samples have a wider composition range of threshold behavior with lower threshold voltages compared to other threshold samples.

Item Type:	Journal Article
Publication:	Journal of Materials Research
Publisher:	Materials Research Society
Additional Information:	Copyright for this article belongs to Materials Research Society.
Department/Centre:	Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited:	16 Sep 2004
Last Modified:	19 Sep 2010 04:15
URI:	http://eprints.iisc.ac.in/id/eprint/1401

Actions (login required)

View Item