Rajanna, K and Mohan, S (1989) Strain-sensitive Properties of Vacuum Evaporated Manganese Films. In: Thin Solid Films, 172 (1). pp. 45-50.
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Abstract
Manganese films have been studied with respect to strain gauge applications, and the criteria for choosing manganese are highlighted. The resistance-strain characteristics of the films have been studied in the thickness range 600–1600$\AA$. The in-situ variation in resistance of the films with temperature has been studied to estimate the temperature coefficient of resistance (TCR). It is found that for thicker films the TCR is around 3.35 × $10^{-4}$ $^oC^{-1}$. The other parameter that has been measured is the gauge factor and its variation with film thickness. The variation of TCR with film thickness is also reported. It is concluded that, since continuous manganese films exhibit better strain sensitivity (gauge factor is approximately 3) and possess a TCR an order of magnitude smaller than most other metal films, they are of potential use for strain gauge application.
Item Type: | Journal Article |
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Publication: | Thin Solid Films |
Publisher: | Elsevier Science B.V. |
Additional Information: | Copyright of this article belongs to Elsevier Science B.V. |
Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics |
Date Deposited: | 13 Feb 2008 |
Last Modified: | 19 Sep 2010 04:42 |
URI: | http://eprints.iisc.ac.in/id/eprint/12932 |
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