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Optical properties of ion assisted deposited $CeO_2$ films

AI-Robaee, Mansour S and Krishna, Ghanashyam M and Rao, Narasimha K and Mohan, S (1991) Optical properties of ion assisted deposited $CeO_2$ films. In: Journal of Vacuum Science and Technology A, 9 (6). pp. 3048-3053.

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Single layer films of $Ce0_2$ have been deposited both by conventional electron beam evaporation and ion assisted deposition with oxygen and argon ions. A broad beam Kaufman ion source (3 cm diam) has been used to generate the ions. A systematic study has been made on optical properties such as refractive index, extinction coefficient and inhomogeneity of the films as a function of: (1) oxygen partial pressure in the range $1 X10^{-4}$ to $1 X10^{-5} mbar$. (2) Incidence of oxygen ions with energy in the range 300-700 eV and current density in the range $50-220,\mu A/cm^2$ . (3) Incidence of mixed argon and oxygen ions of different ratios. The refractive index of the films deposited under the influence of ion bombardment showed higher indices than the conventionally evaporated films. The maximum index obtained with an oxygen ion bombardment was 2.3 at an ion energy of 600 eV and current density of $220,\mu A/cm^2$ . The bombardment of the films with a mixed argonoxygen (25% Ar) ion beam of the same energy and current density was found to further increase the refractive index. The extinction coefficient in both cases was negligible.

Item Type: Journal Article
Publication: Journal of Vacuum Science and Technology A
Publisher: American Vacuum Society
Additional Information: Copyright of this article belongs to American Vacuum Society.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 17 Jul 2007
Last Modified: 30 Jan 2012 06:30
URI: http://eprints.iisc.ac.in/id/eprint/11587

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