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Structural and optical properties of zirconia thin films

Krishna, Ghanashyam M and Rao, Narasimha K and Mohan, S (1990) Structural and optical properties of zirconia thin films. In: Thin Solid Films, 193-19 (1-2). pp. 690-695.

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Thin films of zirconia have been deposited using reactive electron beam evaporation in neutral and ionized oxygen media. The variation in optical properties and structure with post-deposition annealing temperature in the range 300-850°C has been studied. It has been found that the refractive index decreases and the extinction coefficient increases with increasing annealing temperature. Phase transitions have been characterized using IR absorption in conjunction with X-ray diffraction. The effect of ambient background ions on optical properties is not as marked as that on structure.

Item Type: Journal Article
Publication: Thin Solid Films
Publisher: Elsevier
Additional Information: Copyright of this article belongs to Elsevier.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 17 Oct 2007
Last Modified: 19 Sep 2010 04:38
URI: http://eprints.iisc.ac.in/id/eprint/11444

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