Chandrasekhar, N and Schlom, Darrell G (1994) Evidence for surface melting during the growth of high $T_c$ thin films. In: International Conference on Materials and Mechanisms of Superconductivity - High Temperature Superconductors IV, 5-9 July 1994, Grenoble, France, pp. 697-698.
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Abstract
We present reflection high energy electron diffraction (RHEED) spot profile analyses, which show anomalous broadening over very short time scales. Our data can only be interpreted in terms of surface melting. The conclusions are consistent with the thermodynamic phase diagrams and with the vapor-liquid-solid (VLS) mechanism of crystal growth
Item Type: | Conference Paper |
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Publisher: | Elsevier Science B.V. |
Additional Information: | Copyright of this article belongs to Elsevier Science B.V. |
Keywords: | crystal growth;surface melting;thin films |
Department/Centre: | Division of Physical & Mathematical Sciences > Physics |
Date Deposited: | 26 Sep 2007 |
Last Modified: | 19 Sep 2010 04:38 |
URI: | http://eprints.iisc.ac.in/id/eprint/11006 |
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