Evidence for surface melting during the growth of high $T_c$ thin films

Chandrasekhar, N and Schlom, Darrell G (1994) Evidence for surface melting during the growth of high $T_c$ thin films. In: International Conference on Materials and Mechanisms of Superconductivity - High Temperature Superconductors IV, 5-9 July 1994, Grenoble, France, pp. 697-698.

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Abstract

We present reflection high energy electron diffraction (RHEED) spot profile analyses, which show anomalous broadening over very short time scales. Our data can only be interpreted in terms of surface melting. The conclusions are consistent with the thermodynamic phase diagrams and with the vapor-liquid-solid (VLS) mechanism of crystal growth

Item Type:	Conference Paper
Publisher:	Elsevier Science B.V.
Additional Information:	Copyright of this article belongs to Elsevier Science B.V.
Keywords:	crystal growth;surface melting;thin films
Department/Centre:	Division of Physical & Mathematical Sciences > Physics
Date Deposited:	26 Sep 2007
Last Modified:	19 Sep 2010 04:38
URI:	http://eprints.iisc.ac.in/id/eprint/11006

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