Murthy, CNSG and Shanmukh, K and Venkatesh, YV (1995) A new method for pattern classification using self-organizing network. In: Proceedings of Second Asian Conference on Computer Vision: ACCV '95, 5-8 Dec. 1995, Singapore, pp. 111-115.
Full text not available from this repository. (Request a copy)Abstract
A new technique based on self-organization is proposed in this paper for pattern classification. The idea is to have one self-organizing network for each of the exemplars, wherein each network has its neurons arranged in exactly the same way as the corresponding exemplar. Each of the networks is mapped on to the given test pattern using the self-organization technique. Then the error measure is calculated for each of the mappings and the classification is effected. The proposed technique is tested with both noiseless and noisy variations of the exemplars
| Item Type: | Conference Paper |
|---|---|
| Publisher: | Nanyang Technological University |
| Additional Information: | Copyright of this article belongs to Nanyang Technological University. |
| Keywords: | errors;noise;pattern classification;self organising feature maps |
| Department/Centre: | Division of Electrical Sciences > Electrical Engineering |
| Date Deposited: | 17 Sep 2007 |
| Last Modified: | 11 Jan 2012 05:45 |
| URI: | http://eprints.iisc.ac.in/id/eprint/10904 |
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