High-temperature X-ray structural, thermal and dielectric characteristics of ferroelectric $Bi_2VO_{5.5}$

Prasad, KVR and Varma, KBR (1995) High-temperature X-ray structural, thermal and dielectric characteristics of ferroelectric $Bi_2VO_{5.5}$. In: Journal of Materials Science, 30 (24). pp. 6345-6349.

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Abstract

The X-ray powder diffraction, dielectric and thermal studies of bismuth vanadate $(Bi_2VO_{5.5})$ ceramic have been carried but as a function of temperature (300-900 K). The hightemperature X-ray studies, supported by differential scanning calorimetry, clearly demonstrate that $Bi_2VO_{5.5}$ undergoes two major phase transitions at $\sim 730$ and $\sim 835 K$. It was found that the one at 730 K is associated with both the ferroelectric and the crystallographic transition, while at 835 K, $Bi_2VO_{5.5}$ undergoes only the crystallographic transition. Anomalies in both the dielectric constant and specific heat curves have been observed at ,$\sim 730$ and $\sim 835 K$. The total heat, $\Delta Q$, and entropy, $\Delta S$, associated with the transition at 730 K were found to be higher than those at 835 K.

Item Type:	Journal Article
Publication:	Journal of Materials Science
Publisher:	Springer
Additional Information:	Copyright of this article belongs to Springer.
Department/Centre:	Division of Chemical Sciences > Materials Research Centre
Date Deposited:	29 May 2007
Last Modified:	19 Sep 2010 04:35
URI:	http://eprints.iisc.ac.in/id/eprint/10096

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