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Number of items: 3.

Conference Paper

Vasudevamurthy, Rajath and Amrutur, Bharadwaj and Das, Pratap Kumar (2011) A mostly-digital analog scan-out chain for low bandwidth voltage measurement for analog IP test. In: 2011 IEEE International Symposium on Circuits and Systems (ISCAS), 15-18 May 2011, Rio de Janeiro, Brazil.

Journal Article

Vasudevamurthy, Rajath and Das, Pratap Kumar and Amrutur, Bharadwaj (2014) Time-Based All-Digital Technique for Analog Built-in Self-Test. In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 22 (2). pp. 334-342.

Amrutur, Bharadwaj and Das, Pratap Kumar and Vasudevamurthy, Rajath (2011) 0.84 ps Resolution Clock Skew Measurement via Subsampling. In: IEEE Transactions on Very Large Scale Integration Systems, 19 (12). pp. 2267-2275.

This list was generated on Wed Apr 24 20:01:08 2024 IST.