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Ahlawat, Satyadev and Vaghani, Darshit and Tudu, Jaynarayan and Suhag, Ashok (2017) A Cost Effective Technique for Diagnosis of Scan Chain Faults. In: 21st International Symposium on VLSI Design and Test (VDAT), JUN 29-JUL 02, 2017, Indian Inst Technol Roorkee, Roorkee, INDIA, pp. 191-204.
