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Srinivas, MK and Jacob, James and Agrawal, Vishwani D (1995) Functional Test Generation for Non-Scan Sequential Circuits. In: 8th International Conference on VLSI Design, 1995, 4-7 January 1995, New Delhi, India, pp. 47-52.
Sundaram, S and Srinivas, MK (1994) Logic Simulation Using T-Algorithm on Network of Workstations. In: IEEE Region 10's Ninth Annual International Conference. Theme: 'Frontiers of Computer Technology'. TENCON '94, 22-26 August, Singapore, vol.1, 285-289.
Srinivas, MK and Jacob, James and Agrawal, Vishwani D (1992) Finite State Machine Testing Based on Growth and Disappearance Faults. In: Twenty-Second International Symposium on Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers, 8-10 July, Boston,MA, 238 -245.
Jain, Kamal Kumar and Jacob, James and Srinivas, MK (1991) ATPG With Efficient Testability Measures and Partial Fault Simulation. In: 1991 Fourth CSI/IEEE International Symposium on VLSI Design, 4-8 January, New Delhi,India, pp. 35-40.
Srinivas, MK and Radhakrishnan, T (1991) Parallel Processing of a Multilayer Routing Package. In: 1991 IEEE Region 10 International Conference on EC3-Energy, Computer, Communication and Control Systems.TENCON '91, 28-30 August, New Delhi,India, Vol.3, 51-55.
Srinivas, MK and Jacob, James and Agrawal, Vishwani D (1996) Functional Test Generation for Synchronous Sequential Circuits. In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 15 (7). 831 -843.
