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Conference Paper

Shayan, Md and Singh, Virendra and Singh, Adit D and Fujita, Masahiro (2012) SEU Tolerant Robust Memory Cell Design. In: IEEE 18th International On-Line Testing Symposium (IOLTS), JUN 27-29, 2012, Sitges, SPAIN, pp. 13-18.

This list was generated on Thu Mar 28 16:20:36 2024 IST.