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Conference Paper

Murugan, Rajen and Mukherjee, Souvik and Mi, Minhong and Pauc, Lionel and Girardi, Claudio (2012) System-level SoC near-field (NF) emissions: Simulation to measurement correlation. In: 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC), May 29 2012-June 1 2012, San Diego, CA.

This list was generated on Sat Aug 15 17:17:28 2020 IST.