Number of items: 2.
Conference Proceedings
Kumar, Binod and Nehru, Boda and Pandey, Brajesh and Singh, Virendra and Tudu, Jaynarayan
(2017)
A Technique for Low Power, Stuck-at Fault Diagnosable and Reconfigurable Scan Architecture.
In: IEEE East-West Design and Test Symposium (EWDTS), OCT 14-17, 2016, Yerevan, ARMENIA.
Conference Paper
Kumar, Binod and Nehru, Boda and Pandey, Brajesh and Tudu, Jaynarayan
(2017)
Skip-scan: A methodology for test time reduction.
In: ter Science and Automation, Indian Institute of Science, Bangalore, India, 24-27 May 2016, Guwahati, India, pp. 1-6.
This list was generated on Sat Apr 20 06:10:38 2024 IST.
