ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Browse by Author

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Number of items: 1.

Somayaji, Jhnanesh and Kumar, Sampath B and Bhat, M S and Shrivastava, Mayank (2017) Performance and Reliability Codesign for Superjunction Drain Extended MOS Devices. In: IEEE TRANSACTIONS ON ELECTRON DEVICES, 64 (10). pp. 4175-4183.

This list was generated on Wed Jul 24 17:12:16 2024 IST.