Up a level |
Karunagaran, B and Kumar, Rajendra RT and Viswanathan, C and Mangalaraj, D and Narayandass, Sa K and Rao, Mohan G (2003) Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry. In: Crystal Research and Technology, 38 (9). pp. 773-778.
Karunagaran, B and Kumar, Rajendra RT and Mangalaraj, D and Narayandass, Sa K and Rao, Mohan G (2002) Influence of thermal annealing on the composition and structural parameters of DC magnetron sputtered titanium dioxide thin films. In: Crystal Research and Technology, 37 (12). pp. 1285-1292.