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Kumar, Binod and Jindal, Ankit and Tudu, Jaynarayan and Pandey, Brajesh and Singh, Virendra (2017) Revisiting Random Access Scan for Effective hnhancement of Post-silicon Observability. In: 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), JUL 03-05, 2017, Thessaloniki, GREECE, pp. 132-137.
Kumar, Binod and Nehru, Boda and Pandey, Brajesh and Singh, Virendra and Tudu, Jaynarayan (2017) A Technique for Low Power, Stuck-at Fault Diagnosable and Reconfigurable Scan Architecture. In: IEEE East-West Design and Test Symposium (EWDTS), OCT 14-17, 2016, Yerevan, ARMENIA.
Kumar, Binod and Nehru, Boda and Pandey, Brajesh and Tudu, Jaynarayan (2017) Skip-scan: A methodology for test time reduction. In: ter Science and Automation, Indian Institute of Science, Bangalore, India, 24-27 May 2016, Guwahati, India, pp. 1-6.