ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Browse by Author

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Number of items: 3.

Conference Proceedings

Kumar, Binod and Jindal, Ankit and Tudu, Jaynarayan and Pandey, Brajesh and Singh, Virendra (2017) Revisiting Random Access Scan for Effective hnhancement of Post-silicon Observability. In: 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), JUL 03-05, 2017, Thessaloniki, GREECE, pp. 132-137.

Kumar, Binod and Nehru, Boda and Pandey, Brajesh and Singh, Virendra and Tudu, Jaynarayan (2017) A Technique for Low Power, Stuck-at Fault Diagnosable and Reconfigurable Scan Architecture. In: IEEE East-West Design and Test Symposium (EWDTS), OCT 14-17, 2016, Yerevan, ARMENIA.

Conference Paper

Kumar, Binod and Nehru, Boda and Pandey, Brajesh and Tudu, Jaynarayan (2017) Skip-scan: A methodology for test time reduction. In: ter Science and Automation, Indian Institute of Science, Bangalore, India, 24-27 May 2016, Guwahati, India, pp. 1-6.

This list was generated on Wed Apr 24 02:47:11 2024 IST.